Universal test cell

{
  "publication_number": "US10161962B2",
  "country": "US",
  "kind": "B2",
  "title": "Universal test cell",
  "abstract": "In an embodiment, a universal test cell includes a plurality of test slots configured to receive a plurality of universal test containers each including similar dimensions. Each universal test container is configured to enclose each of a plurality of different devices to test. Each universal test container includes an external electrical interface configured to couple to each of the plurality of different devices to test. The universal test cell is configured to test the plurality of different devices while each is located within a universal test container of the plurality of universal test containers. The universal test cell includes a plurality of universal electrical interfaces that are each configured to couple with the external electrical interface of each universal test container.",
  "claims": [
    "1. A universal test cell comprising: a plurality of test slots that receive a plurality of universal test containers each comprising similar dimensions, each universal test container encloses each of a plurality of different devices to test, each universal test container comprises an external electrical interface that couples to each of said plurality of different devices to test, each universal test container internally comprises a baffle for directing airflow, each universal test container comprises a recessed area comprising said external electrical interface, said universal test cell tests said plurality of different devices while each is located within a universal test container of said plurality of universal test containers; and a plurality of universal electrical interfaces that each couples with said external electrical interface of each universal test container.",
    "2. The universal test cell of claim 1, further comprising: a robot installs and uninstalls said plurality of universal test containers with said universal test cell.",
    "3. The universal test cell of claim 1, further comprising: a plurality of universal adaptors provide temperature controlled air flow to said plurality of universal test containers.",
    "4. The universal test cell of claim 1, further comprising: an input port for receiving said plurality of universal test containers; and a robot retrieves said plurality of universal test containers from said input port and installs said plurality of universal test containers into said plurality of test slots.",
    "5. The universal test cell of claim 4, further comprising: an output port for receiving said plurality of universal test containers uninstalled by said robot from said plurality of test slots.",
    "6. The universal test cell of claim 1, wherein each of said plurality of universal test containers comprises an air inlet and an air outlet.",
    "7. The universal test cell of claim 1, wherein one of said plurality of different devices to test comprises a semiconductor chip.",
    "8. The universal test cell of claim 1, wherein one of said plurality of different devices to test comprises a hard disk drive.",
    "9. The universal test cell of claim 1, wherein one of said plurality of different devices to test comprises a solid state drive.",
    "10. A universal test cell system comprising: a plurality of test slots that receive a plurality of universal test containers each comprising similar dimensions and shape, each universal test container encloses each of a plurality of different devices to test, each universal test container comprises an external electrical interface that couples to each of said plurality of different devices to test, each universal test container internally comprises a baffle for directing airflow, each universal test container comprises a recessed area comprising said external electrical interface, said universal test cell tests said plurality of different devices while each is located within a universal test container of said plurality of universal test containers; a bin that holds one or more of said plurality of universal test containers; and a plurality of universal electrical interfaces that each couples with said external electrical interface of each universal test container.",
    "11. The universal test cell system of claim 10, further comprising: a first robot removes each of said plurality of universal test containers from said bin.",
    "12. The universal test cell system of claim 11, further comprising: a second robot receives each of said plurality of universal test containers from said first robot, said second robot installs and uninstalls said plurality of universal test containers with said universal test cell.",
    "13. The universal test cell system of claim 10, wherein each of said plurality of universal test containers comprises a temperature sensor.",
    "14. The universal test cell system of claim 10, further comprising: a plurality of universal adaptors provide temperature controlled air flow to said plurality of universal test containers.",
    "15. The universal test cell system of claim 10, wherein one of said plurality of different devices comprises a printed circuit board.",
    "16. A universal test cell comprising: a plurality of test slots that receive a plurality of universal test containers each comprising similar shape and dimensions, each universal test container encloses each of a plurality of different devices to test, each universal test container comprises an external electrical interface that couples to each of said plurality of different devices to test, each universal test container internally comprises a baffle for directing airflow, each universal test container comprises a recessed area comprising said external electrical interface, each universal test container comprises an air inlet and an air outlet, said universal test cell tests said plurality of different devices at the same time while each is located within a universal test container of said plurality of universal test containers; and a plurality of universal electrical interfaces that each couples with said external electrical interface of each universal test container.",
    "17. The universal test cell of claim 16, further comprising: a robot installs and uninstalls said plurality of universal test containers within said universal test cell.",
    "18. The universal test cell of claim 16, further comprising: a plurality of universal adaptors provide temperature controlled air flow to said plurality of universal test containers via said air inlet.",
    "19. The universal test cell of claim 16, wherein one of said plurality of different devices to test comprises a semiconductor chip.",
    "20. The universal test cell of claim 16, wherein plurality each universal test container comprises an internal electrical interface that is changeable."
  ],
  "description_excerpt": "Conventionally, a manufacturing company or business may have many different product lines. For example, the manufacturing company may produce devices like a semiconductor chip and a solid state drive (SSD) which is much bigger and physically very different from a semiconductor chip. Typically, each time a new product is developed, a test platform is developed by the manufacturing company that can include tester interface electronics, carrier devices, and robots capable of handling and testing each device under test (DUT). As a result, the manufacturing company can eventually have many different product lines and many different test platforms, which are burdensome to maintain and manage.\n\nVarious embodiments in accordance with the invention can address the disadvantages described above by providing a single test platform that is able to test a wide variety of components in an automated way regardless of the physical and electrical interfaces characteristics of the DUT.\n\nIn an embodiment, a universal test cell includes a plurality of test slots configured to receive a plurality of universal test containers each including similar dimensions. Each universal test container is configured to enclose each of a plurality of different devices to test. Each universal test container includes an external electrical interface configured to couple to each of the plurality of different devices to test. The universal test cell is configured to test the plurality of different devices while each is located within a universal test container of the plurality of universal test containers.",
  "cpc": [
    "G01R 1/04",
    "B25J 9/0084",
    "B25J 9/0093",
    "G01R 1/44",
    "G01R 31/26",
    "G01R 31/2801",
    "G01R 31/2851",
    "G01R 31/2893",
    "G11B 19/048"
  ],
  "ipc": [
    "B25J 9/00",
    "G01R 1/04",
    "G01R 1/44",
    "G01R 31/01",
    "G01R 31/26",
    "G01R 31/28",
    "G11B 19/04"
  ],
  "assignees": [
    "Advantest Corp"
  ],
  "inventors": [
    "Ben Rogel-Favila",
    "Roland Wolff",
    "Eric Kushnick",
    "James FISHMAN"
  ],
  "filing_date": "2014-10-15",
  "publication_date": "2018-12-25",
  "grant_date": "2018-12-25",
  "priority_date": "2014-06-06",
  "application_number": "US-201414515422-A",
  "family_id": "54769393",
  "cited_by_count": 4,
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