Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device

{
  "publication_number": "US10530499B2",
  "country": "US",
  "kind": "B2",
  "title": "Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device",
  "abstract": "An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.",
  "claims": [
    "1. An automatic system level testing (ASLT) system for testing smart devices, said system comprising: a system controller operable to be coupled to a smart device, wherein the system controller comprises a memory comprising test logic and a processor; an enclosure comprising a plurality of components, the plurality of components comprising: a robotic arm comprising a stylus attached thereto, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and a platform comprising a device holder attached thereto, wherein the device holder is operable to hold the smart device inserted therein, wherein the platform is operable to rotate in a x-z plane and a y-z plane; and wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic, and further wherein the processor is configured to: retrieve metadata from a plurality of sensors on said smart device; and transmit the metadata to the system controller.",
    "2. The system of claim 1, wherein metadata is retrieved from a gravity sensor of the smart device while the platform is operable to be rotated in the x-z plane and the y-z plane, and wherein the processor is further configured to analyze the metadata to determine functionality of the gravity sensor of the smart device.",
    "3. The system of claim 1, wherein metadata is retrieved from a gyroscope sensor of the smart device while the platform is rotated in the x-z plane and the y-z plane, and wherein the processor is further configured to analyze the metadata to determine functionality of the gyroscope sensor of the smart device.",
    "4. The system of claim 1, wherein metadata is retrieved from a compass of the smart device while the platform is rotated in the x-z plane and the y-z plane, and wherein the processor is further configured to analyze the metadata to determine functionality of the compass of the smart device.",
    "5. The system of claim 1, wherein metadata is retrieved from an accelerometer of the smart device while the platform is rotated in the x-z plane and the y-z plane, and wherein the processor is further configured to analyze the metadata to determine functionality of the accelerometer of the smart device.",
    "6. The system of claim 1, wherein the robotic arm is operable to move in a z direction.",
    "7. The system of claim 6, wherein metadata is retrieved from a proximity sensor of the smart device while the stylus is moved in the z direction in proximity to a touch screen of the smart device, and wherein the processor is further configured to analyze the metadata to determine functionality of the proximity sensor of the smart device.",
    "8. The system of claim 1, wherein metadata is retrieved from a pedometer of the smart device, wherein the processor is further configured to: control the platform to manipulate the smart device to simulate a walking motion; and and analyze the metadata to determine functionality of the pedometer of the smart device.",
    "9. The system of claim 1, wherein the plurality of components further comprises an external accelerometer.",
    "10. The system of claim 9, wherein the processor is further configured to: control the smart device to activate a vibration mode; capture a vibration related data and signature from the smart device using the external accelerometer; and analyze the vibration related data and signature from the smart device to determine proper functionality of the smart device.",
    "11. An automatic system level testing (ASLT) system for testing smart devices, said system comprising: a system controller coupled to a smart device, wherein the system controller comprises a memory comprising test logic and a processor; an enclosure comprising a plurality of components, the plurality of components comprising: a robotic arm comprising a stylus attached thereto, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; a platform comprising a device holder attached thereto, wherein the device holder is operable to hold the smart device, wherein the platform is operable to rotate in a x-z plane and a y-z plane; and an external programmable LED; and wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic, and wherein the processor is further configured to: control the smart device to activate an auto-brightness mode; control the external programmable LED to turn to full brightness mode; and analyze light intensity metadata from the smart device responsive to the brightness mode.",
    "12. The system of claim 11, wherein the processor is further configured to: control the external programmable LED to turn off; and analyze a light intensity metadata from the smart device to determine proper functionality of the auto-brightness mode.",
    "13. The system of claim 11, wherein the plurality of components further comprises an external camera.",
    "14. The system of claim 13, wherein the processor is further configured to: control the external programmable LED to a full brightness mode; control the external camera to capture an image of a display of the smart device; and analyze metadata from the external camera to determine proper functionality of a light sensor of the smart device.",
    "15. The system of claim 14, wherein the processor is further configured to: control the external programmable LED to turn off; control the external camera to capture an image of the display of the smart device; and analyze metadata from the external camera to determine proper functionality of the light sensor of the smart device.",
    "16. An automatic system level testing (ASLT) system for testing smart devices, said system comprising: a system controller operable to be coupled to a smart device, wherein the system controller comprises a memory comprising test logic and a processor; an enclosure comprising a plurality of components, wherein the plurality of components comprise: a robotic arm comprising a stylus attached thereto, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; a platform comprising a device holder affixed thereto, wherein the device holder is operable to hold the smart device, wherein the platform is operable to be controlled to move in an x-y direction and to rotate, wherein the device holder is operable to receive the mobile electronic device inserted there into; and wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic, and wherein the processor is further configured to: control the smart device to activate GPS mode; receiving GPS and location results from the smart device; and analyzing the GPS and location results received from the smart device to determine GPS functionality for the smart device.",
    "17. In a testing system, a method of testing a smart device, the method comprising: registering a model of a smart device inserted into the testing system, wherein the testing system comprises: a system controller operable to be coupled with the smart device, wherein the system controller comprises a memory comprising test logic and a processor; and an enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into, wherein the platform is operable to be controlled to move in an x-y direction and to rotate in an x-z plane and a y-z plane; controlling the smart device and the plurality of components in accordance with the test logic; retrieving metadata from a plurality of sensors on said smart device; and transmitting the metadata to the system controller.",
    "18. The method of claim 17, further comprising: analyzing the metadata to determine a functionality of a gravity sensor of the smart device, wherein the metadata is retrieved from the gravity sensor of the smart device while the platform is rotated in the x-z plane and the y-z plane.",
    "19. The method of claim 17, further comprising: analyzing the metadata to determine a functionality of a gyroscope sensor of the smart device, wherein the metadata is retrieved from the gyroscope sensor of the smart device while the platform is rotated in the x-z plane and the y-z plane.",
    "20. The method of claim 17, further comprising: analyzing the metadata to determine a functionality of a compass of the smart device, wherein the metadata is retrieved from the compass of the smart device while the platform is rotated in the x-z plane and the y-z plane.",
    "21. The method of claim 17, further comprising: analyzing the metadata to determine a functionality of an accelerometer of the smart device, wherein the metadata is retrieved from the accelerometer of the smart device while the platform is rotated in the x-z plane and the y-z plane.",
    "22. The method of claim 17, wherein the robotic arm is operable to move in a z direction.",
    "23. The method of claim 17, further comprising: analyzing the metadata to determine a functionality of a proximity sensor of the smart device, wherein the metadata is retrieved from the proximity sensor of the smart device while the stylus is moved in the z direction in proximity to a touch screen of the smart device.",
    "24. The method of claim 17, further comprising: analyzing the metadata to determine a functionality of a pedometer of the smart device, wherein the metadata is retrieved from the pedometer of the smart device while the platform is controlled to manipulate the smart device to simulate a walking motion thereto."
  ],
  "description_excerpt": "The present disclosure relates generally to the field of electronic device testing systems and more specifically to the field of electronic device testing equipment for testing smart phones and tablets.\n\nAutomatic system level testing (ASLT) can be any testing assembly that performs a test on a semiconductor wafer or die, or a device such as a solid-state drive or a smart phone. ASLT assemblies may be used to execute automated tests that quickly perform measurements and generate test results that can then be analyzed. An ASLT assembly may be anything from a computer system coupled to a meter, to a complicated automated test assembly that may include a custom, dedicated computer control system and many different test instruments that are capable of automatically testing electronics parts, semiconductor wafer testing (such as system-on-chip (SOC) testing) or testing devices such as smart phones. ASLT systems both reduce the amount of time spent on testing devices to ensure that the device functions as designed and serve as a diagnostic tool to determine the presence of faulty components within a given device before it reaches the consumer.\n\nASLT systems to test smart phones, for example, are required at both the point of sale and at the production facilities. Currently, if a user experiences a problem with their phone and brings it into a retail facility, there are no systems in place to exhaustively test the hardware and software on the phone to determine the source of the problem with a high degree of accuracy.",
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  ],
  "assignees": [
    "w2bi Inc"
  ],
  "inventors": [
    "Derek Diperna",
    "Ira Leventhal",
    "Keith SCHAUB",
    "Artun Kutchuk"
  ],
  "filing_date": "2018-09-10",
  "publication_date": "2020-01-07",
  "grant_date": "2020-01-07",
  "priority_date": "2014-12-05",
  "application_number": "US-201816126980-A",
  "family_id": "56164042",
  "cited_by_count": 1,
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