X-ray analysis apparatus

{
  "publication_number": "US9547094B2",
  "country": "US",
  "kind": "B2",
  "title": "X-ray analysis apparatus",
  "abstract": "X-ray analysis of a primary sample such as a flexible sheet 60 uses apparatus having a primary sample holder such as a material feed-through system 20 for moving the flexible sheet through the apparatus. An X-ray analysis head 6 containing an X-ray source and an X-ray detector is mounted on a robot arm 4. The robot arm moves in three dimensions so that the analysis head can be brought into position to measure the flexible sheet as it is being brought through the apparatus by the material feed-through system.",
  "claims": [
    "1. Apparatus for X-ray analysis of a sample comprising: a primary sample holder for holding the sample; an X-ray analysis head containing an X-ray source and an X-ray detector, and a robot arm mounted on the apparatus, the X-ray analysis head being mounted on the robot arm, the robot arm being arranged to move the X-ray analysis head both linearly in three dimensions and rotationally so that the analysis head is brought into position to measure the sample; wherein the primary sample holder is a material feed-through system for moving a flexible sheet through the apparatus.",
    "2. Apparatus according to claim 1 wherein the feed-through system comprises a measurement support pair of rollers for supporting the flexible sheet during measurement.",
    "3. Apparatus according to claim 2 further comprising additional guide rollers for guiding the flexible sheet through the apparatus.",
    "4. Apparatus according to claim 1 further comprising a housing for containing the robot arm and part of the material feed-through system for supporting the flexible sheet for measurement.",
    "5. Apparatus according to claim 1 wherein the robot arm is a six-axis robot arm arranged to move the X-ray analysis head in three linear directions and to rotate the X-ray analysis head about three orthogonal axes.",
    "6. Apparatus according to claim 1 further comprising a fixed sample mounting additional to the primary sample holder.",
    "7. Apparatus according to claim 6 wherein the fixed sample mounting is in the form of a demountable frame.",
    "8. Apparatus according to claim 1 further comprising a location sensor on the robot arm and/or X-ray analysis head for measuring the position of the arm for locating the X-ray analysis head during measurement.",
    "9. Apparatus according to claim 8 wherein the location sensor is a distance sensor for measuring the position of the arm to the flexible sheet or to an additional sample.",
    "10. Apparatus according to claim 1 further comprising a video camera mounted on the robot arm and/or X-ray analysis head for locating the X-ray analysis head during measurement.",
    "11. Apparatus according to any claim 1 wherein the X-ray analysis head is an X-ray fluorescence head.",
    "12. Apparatus according to any claim 1 wherein the X-ray analysis head is an X-ray diffraction head.",
    "13. A method of operation of apparatus according to claim 1 including passing a flexible sheet along the material feed-through system and measuring the composition of the flexible sheet using the X-ray analysis head.",
    "14. A method of operation according to claim 13 further comprising measuring the composition of a reference sample using the X-ray analysis head."
  ],
  "description_excerpt": "The present invention relates to apparatus for measuring a sample such as flexible material using X-ray analysis techniques such as X-ray diffraction or X-ray fluorescence.\n\nX-ray analysis is a widely adopted technique for accurately capturing measurement data for materials analysis. X-ray diffraction, XRD or X-ray fluorescence, XRF, are both appropriate in various circumstances. XRF for example can accurately measure can accurately measure elemental composition in a very wide range of concentrations; among others metal, from low concentration impurities (sub-ppm) to high concentrations of major constituents (up to 100%).\n\nSamples for such X-ray analysis may be prepared by a number of methods, for example by compressing powder to a solid sample, or fusing the powder. X-ray analysis can also be carried out on streaming samples, for example powders.\n\nThere is however a need for the measurement of a wider variety of samples which need not be flat of or known or fixed shape.\n\nIn particular, XRF equipment for measuring flexible sheet material, such as textiles or thin films, of the type that may be wound into rolls, for example, has not previously been available.\n\nFurther difficulties may arise with non-flat samples of various shapes.\n\nFor the most accurate analysis, both XRF and XRD require calibration and this is a particular issue for XRF. There is accordingly a need for XRD or XRF equipment to measure comparable calibration samples.\n\nAccording to a first aspect of the invention, there is provided apparatus for X-ray analysis of a sample, comprising:",
  "cpc": [
    "G01T 7/08",
    "B25J 9/0093",
    "G01N 2223/308",
    "G01N 2223/309",
    "G01N 2223/32",
    "G01N 2223/642",
    "G01N 23/20025",
    "G01N 23/207",
    "G01N 23/2204",
    "G01N 23/223",
    "G01N 33/367",
    "Y10S 901/15"
  ],
  "ipc": [
    "B25J 9/00",
    "G01N 23/207",
    "G01N 23/223",
    "G01T 7/08"
  ],
  "assignees": [
    "Panalytical BV"
  ],
  "inventors": [
    "Jeroen RINSEMA",
    "Mark Alexander Pals"
  ],
  "filing_date": "2015-02-17",
  "publication_date": "2017-01-17",
  "grant_date": "2017-01-17",
  "priority_date": "2014-02-18",
  "application_number": "US-201514624005-A",
  "family_id": "50115712",
  "cited_by_count": 4,
  "citations": [
    "US4047029A",
    "US5162131A",
    "US20110119020A1"
  ]
}