Fine particle measuring method, substrate for measurement, and measuring apparatus

{
  "publication_number": "US2009116005A1",
  "country": "US",
  "kind": "A1",
  "title": "Fine particle measuring method, substrate for measurement, and measuring apparatus",
  "abstract": "A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels is disclosed. The method includes: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels; detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels.",
  "claims": [
    "1. A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels, the method comprising the steps of: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels; detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels.",
    "2. The fine particle measuring method according to claim 1, wherein the control is made on the basis of a time difference between a detection time of a change of the optical property caused by one of the reference regions and a detection time of a change of the optical property caused by another one of the reference regions and the number of sample fluidic channels.",
    "3. The fine particle measuring method according to. claim 2, wherein the reference regions are reference fluidic channels into which fine particles for reference or/and a fluorescent material for reference are introduced, and the change of the optical property is caused by the fine particles for reference or/and the fluorescent material for reference.",
    "4. A substrate for fine particle measurement in which a plurality of sample fluidic channels are provided at predetermined distances and optical measurement of fine particles introduced into the sample fluidic channels is performed by scanning light to the sample fluidic channels, the substrate comprising: at least two or more reference regions capable of causing a change of optical property of the light irradiated, the reference regions being provided together with the sample fluidic channels.",
    "5. A fine particle measuring apparatus of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels provided at predetermined distances on a substrate by scanning light to the sample fluidic channels, the apparatus comprising: a light irradiating section that sequentially irradiates the light to at least two or more reference regions provided together with the sample fluidic channels; a light detecting section that detects a change of optical property occurring in the light due to the reference regions; and a light control section that controls timing of emission of the light to the sample fluidic channels on the basis of an output from the light detecting section."
  ],
  "description_excerpt": "1. Field of the Invention\n\nThe present invention relates to a fine particle measuring method, a substrate for fine particle measurement, and a fine particle measuring apparatus. More specifically, the present invention relates to a fine particle measuring method capable of controlling the timing of emission of light to sample fluidic channels into which fine particles are introduced.\n\n2. Description of the Related Art\n\nIn order to distinguish fine particles, such as biological fine particles including cells, microorganisms, and liposomes, or synthetic particles including latex particles, gel particles, and industrial particles, apparatuses that introduce fine-particle-dispersed liquid into fluidic channels and optically measure the fine particles introduced into the fluidic channels have been used in the related art.\n\nAs an example, there is a particle analyzer that distinguishes synthetic particles according to the size or shape. The particle analyzer measures the element composition or diameter of a fine particle and the number of particles by exciting and emitting fine particles in helium (He) plasma one by one to perform spectral detection of the fine particles.\n\nMoreover, for the biological fine particles, optical measurement using flow cytometry (flow cytometer) is widely performed.",
  "cpc": [
    "G01N 15/1425",
    "G01N 15/1436",
    "G01N 15/1459",
    "G01N 15/1484",
    "G01N 2015/1006",
    "G01N 2015/1497",
    "G01N 2021/058",
    "G01N 2021/6419",
    "G01N 2021/6421",
    "G01N 21/00",
    "G01N 21/25",
    "G01N 21/6428",
    "G01N 21/645",
    "G01N 2201/10",
    "G01N 2201/11"
  ],
  "ipc": [
    "G01N 21/05",
    "G01N 35/08"
  ],
  "inventors": [
    "Motohiro Furuki",
    "Shingo Imanishi",
    "Masataka Shinoda",
    "Akitoshi Suzuki",
    "Kazushi Miyake"
  ],
  "filing_date": "2008-10-27",
  "publication_date": "2009-05-07",
  "priority_date": "2007-11-02",
  "application_number": "US-25923508-A",
  "family_id": "40293596",
  "cited_by_count": 30,
  "citations": [
    "US5112134A",
    "US5234665A",
    "US5870182A",
    "US20020176078A1",
    "US20080186488A1",
    "US20090101847A1"
  ]
}