MLchartDataset catalogue

Atomic Force Microscopy

Term · Environment · MLC-T-ENV-002361

A technique utilizing a scanning probe to image and analyze the surface of a material with atomic-level resolution.

Table 1. Record
IdentifierMLC-T-ENV-002361
FieldEnvironment
AbbreviationAFM
ReferencesNational Cancer Institute Thesaurus (CC BY 4.0)
Record as JSON 
{
  "id": "MLC-T-ENV-002361",
  "term": "Atomic Force Microscopy",
  "field": "Environment",
  "definition": "A technique utilizing a scanning probe to image and analyze the surface of a material with atomic-level resolution.",
  "abbreviation": "AFM",
  "references": [
    "National Cancer Institute Thesaurus"
  ],
  "url": "https://mlchart.com/terminology/environment/atomic-force-microscopy/"
}

Record 2,361 of 30,736 in Environment terminology (MLC-0121). Request the full dataset.