Atomic force microscopy

{
  "id": "MLC-T-CHM-000895",
  "term": "Atomic force microscopy",
  "field": "Chemistry",
  "definition": "A high-resolution scanning probe microscopy technique that images the topography of a sample surface by detecting the forces between a sharp probe and the surface. A cantilever with a sharp tip is scanned across the sample, and its deflection is measured to create a three-dimensional surface profile. This method can achieve atomic-scale resolution.",
  "synonyms": [
    "scanning force microscopy (SFM)"
  ],
  "subject": "Polymer",
  "references": [
    "PAC, 2020, 92, 1861. 'Terminology of polymers in advanced lithography (IUPAC Recommendations 2020)' on page 1867 (https://doi.org/10.1515/pac-2018-1215)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/atomic-force-microscopy/"
}