Scanning electron microscopy

{
  "id": "MLC-T-CHM-010548",
  "term": "Scanning electron microscopy",
  "field": "Chemistry",
  "definition": "An electron microscopy technique that creates images of a sample's surface by scanning it with a high-energy beam of electrons. As the beam interacts with atoms at the sample's surface, it generates signals from secondary electrons, backscattered electrons, and characteristic X-rays. These signals are collected by detectors to form a three-dimensional-appearing image that reveals information about the sample's surface topography and composition.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "back scattered electrons",
    "secondary electrons"
  ],
  "references": [
    "PAC, 1983, 55, 2023. 'Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)' on page 2024 (https://doi.org/10.1351/pac198355122023)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/scanning-electron-microscopy/"
}