Backscattered electron
Term · Chemistry · MLC-T-CHM-001082
An electron from the primary incident beam that has undergone elastic scattering within a solid sample and subsequently emerges from the surface. These electrons carry information about the atomic number and topography of the sample due to their high energy and sensitivity to material density. They are commonly used in scanning electron microscopy for compositional contrast imaging.
| Identifier | MLC-T-CHM-001082 |
|---|---|
| Field | Chemistry |
| Subject | Analytical Chemistry |
| References | PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1821 (https://doi.org/10.1515/pac-2019-0404) |
| See also | Primary beam |
Record as JSON
{
"id": "MLC-T-CHM-001082",
"term": "Backscattered electron",
"field": "Chemistry",
"definition": "An electron from the primary incident beam that has undergone elastic scattering within a solid sample and subsequently emerges from the surface. These electrons carry information about the atomic number and topography of the sample due to their high energy and sensitivity to material density. They are commonly used in scanning electron microscopy for compositional contrast imaging.",
"subject": "Analytical Chemistry",
"see_also": [
"primary beam"
],
"references": [
"PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1821 (https://doi.org/10.1515/pac-2019-0404)"
],
"url": "https://mlchart.com/terminology/chemistry/backscattered-electron/"
}
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