Primary beam

{
  "id": "MLC-T-CHM-009422",
  "term": "Primary beam",
  "field": "Chemistry",
  "definition": "A directed flux of particles or photons incident on a sample in a surface analysis technique, which excites the emission of the secondary particles or radiation that are then detected. The beam type depends on the method: X-ray photons in X-ray photoelectron spectroscopy, electrons in Auger electron spectroscopy and ions in secondary ion mass spectrometry.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "flux of a beam of particles"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1810 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/primary-beam/"
}