Secondary ion

{
  "id": "MLC-T-CHM-010615",
  "term": "Secondary ion",
  "field": "Chemistry",
  "definition": "An ion that is ejected from the surface of a solid material as a result of bombardment by a primary ion beam. These ions can be either positively or negatively charged and consist of single atoms, clusters of atoms, or molecular fragments. The analysis of secondary ions forms the basis of secondary ion mass spectrometry (SIMS).",
  "subject": "Analytical Chemistry",
  "see_also": [
    "primary ion"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1844 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/secondary-ion/"
}