Secondary-ion yield

{
  "id": "MLC-T-CHM-010640",
  "term": "Secondary-ion yield",
  "field": "Chemistry",
  "definition": "The number of secondary ions produced per incident primary ion during the sputtering process in techniques like secondary ion mass spectrometry (SIMS). This value quantifies the efficiency of ion formation from a bombarded surface. It is influenced by factors such as the primary ion energy, angle of incidence, and the chemical environment of the sputtered species, and can vary significantly between different elements and matrices.",
  "subject": "Analytical Chemistry",
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1845 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/secondary-ion-yield/"
}