SIMS ion image

{
  "id": "MLC-T-CHM-010876",
  "term": "SIMS ion image",
  "field": "Chemistry",
  "definition": "A two-dimensional spatial distribution map of specific secondary ions generated from a sample surface during secondary-ion mass spectrometry (SIMS) analysis. This image is created by rastering a primary ion beam across the surface and recording the intensity of selected secondary ions at each pixel. It provides information about the elemental or molecular composition and distribution on the sample surface.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "secondary-ion mass spectrometry",
    "secondary ion",
    "surface map"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1845 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/sims-ion-image/"
}