Fast-atom bombardment secondary ion mass spectrometry

{
  "id": "MLC-T-CHM-004355",
  "term": "Fast-atom bombardment secondary ion mass spectrometry",
  "field": "Chemistry",
  "definition": "A surface analysis technique that combines fast-atom bombardment (FAB) for sample ionization with secondary ion mass spectrometry (SIMS) for mass analysis. A beam of energetic neutral atoms strikes the sample surface, causing the desorption and ionization of secondary ions. This method is suitable for analyzing organic and inorganic materials, providing information about their surface composition.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "secondary-ion mass spectrometry",
    "primary ion"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1839 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/fast-atom-bombardment-secondary-ion-mass-spectrometry/"
}