MLchartDataset catalogue

Ion microscopy

Term · Chemistry · MLC-T-CHM-006087

A surface analysis technique that uses a focused beam of primary ions to sputter material from a sample surface. The secondary ions produced are then analyzed by mass spectrometry to create elemental or isotopic images of the surface. This method provides high spatial resolution, typically in the micrometer to sub-micrometer range.

Table 1. Record
IdentifierMLC-T-CHM-006087
FieldChemistry
SubjectAnalytical Chemistry
ReferencesOrange Book, 2nd ed., p. 249 (https://media.iupac.org/publications/analytical_compendium/)
See alsoMass spectrometry
Record as JSON
{
  "id": "MLC-T-CHM-006087",
  "term": "Ion microscopy",
  "field": "Chemistry",
  "definition": "A surface analysis technique that uses a focused beam of primary ions to sputter material from a sample surface. The secondary ions produced are then analyzed by mass spectrometry to create elemental or isotopic images of the surface. This method provides high spatial resolution, typically in the micrometer to sub-micrometer range.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "mass spectrometry"
  ],
  "references": [
    "Orange Book, 2nd ed., p. 249 (https://media.iupac.org/publications/analytical_compendium/)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/ion-microscopy/"
}

Record 6,458 of 13,676 in Chemistry terminology (MLC-0109). Request the full dataset.