Dynamic secondary-ion mass spectrometry

{
  "id": "MLC-T-CHM-003501",
  "term": "Dynamic secondary-ion mass spectrometry",
  "field": "Chemistry",
  "definition": "A surface analysis technique that uses a focused primary ion beam to continuously sputter material from a sample surface, generating secondary ions that are then mass analyzed. This method provides elemental and isotopic depth profiles by monitoring the secondary ion signal as a function of sputtering time. It is capable of detecting trace elements with high sensitivity, often down to parts per billion concentrations.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "secondary-ion mass spectrometry"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1786 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/dynamic-secondary-ion-mass-spectrometry/"
}