Static secondary-ion mass spectrometry

{
  "id": "MLC-T-CHM-011332",
  "term": "Static secondary-ion mass spectrometry",
  "field": "Chemistry",
  "definition": "A secondary-ion mass spectrometry method that uses a low primary-ion current density so that only the outermost surface layer is sampled and little damage builds up, in contrast with dynamic SIMS, which profiles components in depth. The ion dose during a measurement is kept below about 10^12 ions per square centimetre, a limit that varies with the material and with how large the fragments under study are. Secondary ions are usually detected with a time-of-flight analyser, giving TOF-SIMS.",
  "subject": "Analytical Chemistry",
  "see_also": [
    "areic dose",
    "dynamic secondary-ion mass spectrometry",
    "secondary-ion mass spectrometry"
  ],
  "references": [
    "PAC, 2020, 92, 1781. 'Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)' on page 1789 (https://doi.org/10.1515/pac-2019-0404)"
  ],
  "url": "https://mlchart.com/terminology/chemistry/static-secondary-ion-mass-spectrometry/"
}