MLchartDataset catalogue

DUT

Term · Computing and IT · MLC-T-CMP-000353

Device Under Test, a term used in manufacturing and engineering to refer to a product or component that is undergoing testing to verify its functionality, performance, or compliance with specifications. This can range from individual integrated circuits to complete electronic systems. The DUT is connected to test equipment that applies inputs and measures outputs to assess its behavior.

Table 1. Record
IdentifierMLC-T-CMP-000353
FieldComputing and IT
SubjectHardware
Record as JSON 
{
  "id": "MLC-T-CMP-000353",
  "term": "DUT",
  "field": "Computing and IT",
  "definition": "Device Under Test, a term used in manufacturing and engineering to refer to a product or component that is undergoing testing to verify its functionality, performance, or compliance with specifications. This can range from individual integrated circuits to complete electronic systems. The DUT is connected to test equipment that applies inputs and measures outputs to assess its behavior.",
  "subject": "Hardware",
  "url": "https://mlchart.com/terminology/computing/dut/"
}

Record 391 of 1,553 in Computing and IT terminology (MLC-0101). Request the full dataset.