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Patent · US10192734B2 · B2 · US

Short inorganic trisilylamine-based polysilazanes for thin film deposition

(11) Publication number
US10192734B2
(21) Application number
15/661,576
(22) Filing date
2017-07-27
(30) Priority date
2016-12-11
(43) Publication date
2019-01-29
(45) Date of grant
2019-01-29
(52) CPC
  • H10P Generic processes or apparatus for the manufacture or treatment of devices covered by class H10: 14/6682, 14/6336, 14/6339, 14/6689, 14/69215, 14/69433
  • C07F Acyclic, carbocyclic or heterocyclic compounds containing elements other than carbon, hydrogen, halogen, oxygen, nitrogen, sulfur, selenium or tellurium: 7/10
  • C23C Coating metallic material; coating material with metallic material; surface treatment of metallic material by diffusion into the surface, by chemical conversion or substitution; coating by vacuum evaporation, by sputtering, by ion implantation or by chemical vapour deposition, in general: 16/345, 16/402, 16/45553
  • H01L Electric elements: 21/02164, 21/0217, 21/02211, 21/02222, 21/02274, 21/0228
(73) Assignee
AIR LIQUIDE ADVANCED MAT INC; LAIR LIQUIDE SA POUR L ETUDE ET LEXPLOITATION DES PROCEDES GEORGES CLAUDE; AIR LIQUIDE ADVANCED MAT LLC; LAIR LIQUIDE SA POUR LETUDE ET LEXPLORATION DES PROCEDES GEORGES CLAUDE
(54) Title
Short inorganic trisilylamine-based polysilazanes for thin film deposition
(57) Abstract

Si-containing film forming compositions comprising Si - C free and volatile silazane-containing precursors are disclosed. The compositions may be used to deposit high purity thin films. The Si - C free and volatile silazane-containing precursors have the formulae: [(SiR 3) 2 NSiH 2] m - NH 2-m - C≡N, with m =1 or 2; (a) [(SiR 3) 2 NSiH 2] n - NL 3-n,with n =2 or 3; (b) (SiH 3) 2 NSiH 2 - O - SiH 2 N(SiH 3) 2; and (c) (SiR′ 3) 2 N - SiH 2 - N(SiR′ 3) 2; (d) with each R independently selected from H, a dialkylamino group, or an amidinate; each R′ independently selected from H, a dialkylamino group, or an amidinate, with the provision that all R′ are not H; and L is selected from H or a C 1 -C 6 hydrocarbyl group.

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Claims (11)

  1. A silicon-containing film forming composition comprising a precursor selected from the group consisting of: [(SiR 3) 2 NSiH 2] m - NH 2-m - C≡N, with m= 1 or 2; (a) [(SiR 3) 2 NSiH 2] n - NL 3-n,with n= 2 or 3; (b) (SiH 3) 2 NSiH 2 - O - SiH 2 N(SiH 3) 2; and (c) (SiR′ 3) 2 N - SiH 2 - N(SiR′ 3) 2; (d) wherein each R is independently selected from H, a dialkylamino group having the formula NR 1 R 2, or an amidinate, Each R′ is independently selected from H, a dialkylamino group having the formula NR 1 R 2, or an amidinate, with the provision that all R′ are not H, R 1 and R 2 are independently selected from H or a C1-C12 hydrocarbyl group, with the provision that R 1 and R 2 cannot be simultaneously equal to H, and that if R 1 is H, then R 2 is a C 2 -C12 hydrocarbyl group, and NR′ R 2 may together form an N-containing heterocyclic ligand, and L is selected from H or a C 1 -C 6 hydrocarbyl group.
  2. The silicon-containing film forming composition of claim 1, wherein the precursor is (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NR 1 R 2), (SiH 3) 2 NSiH 2 - O - SiH 2 N(SiH 3) 2, [(SiH 3) 2 NSiH 2] - NH - C≡N, or [(SiH 3) 2 NSiH 2] 2 N - C≡N.
  3. The silicon-containing film forming composition of claim 1, wherein the precursor is [(SiH 3) 2 NSiH 2] 2 NH or [(SiH 3) 2 NSiH 2] 3 N.
  4. The silicon-containing film forming composition of claim 1, wherein the precursor is (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NMe 2), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NEt 2), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NEtMe), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NiPr 2), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NtBu 2), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NnBu 2), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NsecBu 2), or (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NHtBu).
  5. A method of deposit a silicon-containing film on a substrate by a chemical vapor deposition method, the method comprising introducing into a reactor containing a substrate a vapor including the Si-containing film forming composition of claim 1; depositing at least part of the precursor onto the substrate to form the silicon-containing film on the substrate using a chemical vapor deposition process.
  6. The method of claim 5, wherein the chemical vapor deposition method is an atomic layer deposition process or a plasma enhanced atomic layer deposition process.
  7. The method of claim 5, wherein the silicon-containing film is a silicon oxide film.
  8. The method of claim 5, wherein the silicon-containing film is a silicon nitride film.
  9. The method of claim 5, wherein the substrate is a silicon wafer.
  10. The method of claim 5, wherein the substrate is glass.
  11. The method of claim 5, wherein the substrate is an organic material.

Citations (57)

  • DE1158972B
  • EP2000561A1
  • KR20120024473A
  • KR20120099270A
  • KR20130135793A
  • KR20140057908A
  • US2005070717A1
  • US2005181633A1
  • US2006222583A1
  • US2007010072A1
  • US2008045723A1
  • US2008241575A1
  • US2008268642A1
  • US2009075490A1
  • US2009111284A1
  • US2009137100A1
  • US2009256127A1
  • US2009291872A1
  • US2009291874A1
  • US2009299084A1
  • US2010104755A1
  • US2010221428A1
  • US2011129616A1
  • US2012017934A1
  • US2012058282A1
  • US2012213940A1
  • US2012220139A1
  • US2013089487A1
  • US2013143018A1
  • US2013189854A1
  • US2013224097A1
  • US2013323435A1
  • US2014051264A1
  • US2014158580A1
  • US2014193953A1
  • US2015376211A1
  • US2016049293A1
  • US2016225616A1
  • US4675424A
  • US5413813A
  • US5874368A
  • US7638645B2
  • US7838329B2
  • US8357430B2
  • US8409513B2
  • US8771807B2
  • WO2006136584A1
  • WO2007008705A2
  • WO2009087609A2
  • WO2011056519A2
  • WO2015047914A1
  • WO2015190749A1
  • WO2016065219A1
  • WO2016065221A1
  • WO2016160990A1
  • WO2017070192A1
  • WO2017147150A1
Record as JSON
{
  "publication_number": "US10192734B2",
  "country": "US",
  "kind": "B2",
  "title": "Short inorganic trisilylamine-based polysilazanes for thin film deposition",
  "abstract": "Si-containing film forming compositions comprising Si - C free and volatile silazane-containing precursors are disclosed. The compositions may be used to deposit high purity thin films. The Si - C free and volatile silazane-containing precursors have the formulae: [(SiR 3) 2 NSiH 2] m - NH 2-m - C≡N, with m =1 or 2; (a) [(SiR 3) 2 NSiH 2] n - NL 3-n,with n =2 or 3; (b) (SiH 3) 2 NSiH 2 - O - SiH 2 N(SiH 3) 2; and (c) (SiR′ 3) 2 N - SiH 2 - N(SiR′ 3) 2; (d) with each R independently selected from H, a dialkylamino group, or an amidinate; each R′ independently selected from H, a dialkylamino group, or an amidinate, with the provision that all R′ are not H; and L is selected from H or a C 1 -C 6 hydrocarbyl group.",
  "claims": [
    "1. A silicon-containing film forming composition comprising a precursor selected from the group consisting of: [(SiR 3) 2 NSiH 2] m - NH 2-m - C≡N, with m= 1 or 2; (a) [(SiR 3) 2 NSiH 2] n - NL 3-n,with n= 2 or 3; (b) (SiH 3) 2 NSiH 2 - O - SiH 2 N(SiH 3) 2; and (c) (SiR′ 3) 2 N - SiH 2 - N(SiR′ 3) 2; (d) wherein each R is independently selected from H, a dialkylamino group having the formula NR 1 R 2, or an amidinate, Each R′ is independently selected from H, a dialkylamino group having the formula NR 1 R 2, or an amidinate, with the provision that all R′ are not H, R 1 and R 2 are independently selected from H or a C1-C12 hydrocarbyl group, with the provision that R 1 and R 2 cannot be simultaneously equal to H, and that if R 1 is H, then R 2 is a C 2 -C12 hydrocarbyl group, and NR′ R 2 may together form an N-containing heterocyclic ligand, and L is selected from H or a C 1 -C 6 hydrocarbyl group.",
    "2. The silicon-containing film forming composition of claim 1, wherein the precursor is (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NR 1 R 2), (SiH 3) 2 NSiH 2 - O - SiH 2 N(SiH 3) 2, [(SiH 3) 2 NSiH 2] - NH - C≡N, or [(SiH 3) 2 NSiH 2] 2 N - C≡N.",
    "3. The silicon-containing film forming composition of claim 1, wherein the precursor is [(SiH 3) 2 NSiH 2] 2 NH or [(SiH 3) 2 NSiH 2] 3 N.",
    "4. The silicon-containing film forming composition of claim 1, wherein the precursor is (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NMe 2), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NEt 2), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NEtMe), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NiPr 2), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NtBu 2), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NnBu 2), (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NsecBu 2), or (SiH 3) 2 N - SiH 2 - N(SiH 3)(SiH 2 NHtBu).",
    "5. A method of deposit a silicon-containing film on a substrate by a chemical vapor deposition method, the method comprising introducing into a reactor containing a substrate a vapor including the Si-containing film forming composition of claim 1; depositing at least part of the precursor onto the substrate to form the silicon-containing film on the substrate using a chemical vapor deposition process.",
    "6. The method of claim 5, wherein the chemical vapor deposition method is an atomic layer deposition process or a plasma enhanced atomic layer deposition process.",
    "7. The method of claim 5, wherein the silicon-containing film is a silicon oxide film.",
    "8. The method of claim 5, wherein the silicon-containing film is a silicon nitride film.",
    "9. The method of claim 5, wherein the substrate is a silicon wafer.",
    "10. The method of claim 5, wherein the substrate is glass.",
    "11. The method of claim 5, wherein the substrate is an organic material."
  ],
  "cpc": [
    "H10P 14/6682",
    "C07F 7/10",
    "C23C 16/345",
    "C23C 16/402",
    "C23C 16/45553",
    "H01L 21/02164",
    "H01L 21/0217",
    "H01L 21/02211",
    "H01L 21/02222",
    "H01L 21/02274",
    "H01L 21/0228",
    "H10P 14/6336",
    "H10P 14/6339",
    "H10P 14/6689",
    "H10P 14/69215",
    "H10P 14/69433"
  ],
  "assignees": [
    "AIR LIQUIDE ADVANCED MAT INC",
    "LAIR LIQUIDE SA POUR L ETUDE ET LEXPLOITATION DES PROCEDES GEORGES CLAUDE",
    "AIR LIQUIDE ADVANCED MAT LLC",
    "LAIR LIQUIDE SA POUR LETUDE ET LEXPLORATION DES PROCEDES GEORGES CLAUDE"
  ],
  "filing_date": "2017-07-27",
  "publication_date": "2019-01-29",
  "grant_date": "2019-01-29",
  "priority_date": "2016-12-11",
  "application_number": "US-201715661576-A",
  "family_id": "60243685",
  "citations": [
    "DE1158972B",
    "EP2000561A1",
    "KR20120024473A",
    "KR20120099270A",
    "KR20130135793A",
    "KR20140057908A",
    "US2005070717A1",
    "US2005181633A1",
    "US2006222583A1",
    "US2007010072A1",
    "US2008045723A1",
    "US2008241575A1",
    "US2008268642A1",
    "US2009075490A1",
    "US2009111284A1",
    "US2009137100A1",
    "US2009256127A1",
    "US2009291872A1",
    "US2009291874A1",
    "US2009299084A1",
    "US2010104755A1",
    "US2010221428A1",
    "US2011129616A1",
    "US2012017934A1",
    "US2012058282A1",
    "US2012213940A1",
    "US2012220139A1",
    "US2013089487A1",
    "US2013143018A1",
    "US2013189854A1",
    "US2013224097A1",
    "US2013323435A1",
    "US2014051264A1",
    "US2014158580A1",
    "US2014193953A1",
    "US2015376211A1",
    "US2016049293A1",
    "US2016225616A1",
    "US4675424A",
    "US5413813A",
    "US5874368A",
    "US7638645B2",
    "US7838329B2",
    "US8357430B2",
    "US8409513B2",
    "US8771807B2",
    "WO2006136584A1",
    "WO2007008705A2",
    "WO2009087609A2",
    "WO2011056519A2",
    "WO2015047914A1",
    "WO2015190749A1",
    "WO2016065219A1",
    "WO2016065221A1",
    "WO2016160990A1",
    "WO2017070192A1",
    "WO2017147150A1"
  ]
}

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