SGM
Term · Industrial and trades · MLC-T-IND-005185
A scanning probe microscopy technique, Scanning Gate Microscopy (SGM), that images the flow of electrons in a semiconductor or nanostructure. A sharp, biased probe tip is scanned across the sample's surface, acting as a movable electrostatic gate that locally perturbs the electron transport. The resulting change in conductance is recorded at each point to form a two-dimensional map of electron behavior.
| Identifier | MLC-T-IND-005185 |
|---|---|
| Field | Industrial and trades |
| Subject | Optics and imaging |
| Translations | German: SGM; Spanish: SGM; French: SGM |
Record as JSON
{
"id": "MLC-T-IND-005185",
"term": "SGM",
"field": "Industrial and trades",
"definition": "A scanning probe microscopy technique, Scanning Gate Microscopy (SGM), that images the flow of electrons in a semiconductor or nanostructure. A sharp, biased probe tip is scanned across the sample's surface, acting as a movable electrostatic gate that locally perturbs the electron transport. The resulting change in conductance is recorded at each point to form a two-dimensional map of electron behavior.",
"subject": "Optics and imaging",
"translations": {
"de": "SGM",
"es": "SGM",
"fr": "SGM"
},
"url": "https://mlchart.com/terminology/industrial/sgm/"
}
Record 5,654 of 7,361 in Industrial and trades terminology (MLC-0113). Request the full dataset.