SPM

{
  "id": "MLC-T-IND-005543",
  "term": "SPM",
  "field": "Industrial and trades",
  "definition": "A family of instruments known as Scanning Probe Microscopes used to create images of surfaces at the atomic level. An SPM operates by scanning a sharp physical probe across a sample, measuring local properties like topography, friction, or magnetic fields. This category includes the atomic force microscope (AFM) and the scanning tunneling microscope (STM), which provide resolutions down to the nanometer scale.",
  "subject": "Electrical engineering",
  "translations": {
    "de": "SPM",
    "es": "SPM",
    "fr": "SPM"
  },
  "url": "https://mlchart.com/terminology/industrial/spm/"
}