MLchartDataset catalogue

Fault detection and classification

Term · Semiconductors · MLC-T-SEM-000131

A systematic process, abbreviated as FDC, that monitors sensor data from manufacturing equipment in real time to identify deviations from normal operating conditions and categorize their root cause. The system first detects an anomaly or fault and then classifies it into a known category, such as a sensor failure, process drift, or equipment malfunction. FDC systems apply statistical process control, machine learning models, or physics-based models to analyze high-frequency sensor data from the equipment.

Table 1. Record
IdentifierMLC-T-SEM-000131
FieldSemiconductors
SubjectSmart Manufacturing & AI
AbbreviationFDC
Record as JSON 
{
  "id": "MLC-T-SEM-000131",
  "term": "Fault detection and classification",
  "field": "Semiconductors",
  "definition": "A systematic process, abbreviated as FDC, that monitors sensor data from manufacturing equipment in real time to identify deviations from normal operating conditions and categorize their root cause. The system first detects an anomaly or fault and then classifies it into a known category, such as a sensor failure, process drift, or equipment malfunction. FDC systems apply statistical process control, machine learning models, or physics-based models to analyze high-frequency sensor data from the equipment.",
  "abbreviation": "FDC",
  "subject": "Smart Manufacturing & AI",
  "url": "https://mlchart.com/terminology/semiconductors/fault-detection-and-classification/"
}

Record 130 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.