MLchartDataset catalogue

Automatic defect classification

Term · Semiconductors · MLC-T-SEM-000032

A process that uses machine vision and algorithms to automatically identify, categorize, and count defects found on semiconductor wafers during inspection. This system analyzes images captured by inspection tools and assigns each detected anomaly to a predefined defect type. ADC systems provide rapid feedback on manufacturing process health, often classifying defects into categories such as particles, scratches, or pattern defects.

Table 1. Record
IdentifierMLC-T-SEM-000032
FieldSemiconductors
SubjectMetrology, Inspection & Yield
AbbreviationADC
Record as JSON 
{
  "id": "MLC-T-SEM-000032",
  "term": "Automatic defect classification",
  "field": "Semiconductors",
  "definition": "A process that uses machine vision and algorithms to automatically identify, categorize, and count defects found on semiconductor wafers during inspection. This system analyzes images captured by inspection tools and assigns each detected anomaly to a predefined defect type. ADC systems provide rapid feedback on manufacturing process health, often classifying defects into categories such as particles, scratches, or pattern defects.",
  "abbreviation": "ADC",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/automatic-defect-classification/"
}

Record 24 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.