MLchartDataset catalogue

Automated test equipment

Term · Semiconductors · MLC-T-SEM-000031

Computer-controlled systems designed to perform functional and parametric tests on semiconductor devices, printed circuit boards, and electronic assemblies. These systems apply electrical signals and measure responses to verify performance and identify defects during manufacturing. ATE typically consists of a test head, a handler or prober, and a control computer running specialized software, capable of testing thousands of devices per hour.

Table 1. Record
IdentifierMLC-T-SEM-000031
FieldSemiconductors
SubjectTest & Reliability
AbbreviationATE
Record as JSON 
{
  "id": "MLC-T-SEM-000031",
  "term": "Automated test equipment",
  "field": "Semiconductors",
  "definition": "Computer-controlled systems designed to perform functional and parametric tests on semiconductor devices, printed circuit boards, and electronic assemblies. These systems apply electrical signals and measure responses to verify performance and identify defects during manufacturing. ATE typically consists of a test head, a handler or prober, and a control computer running specialized software, capable of testing thousands of devices per hour.",
  "abbreviation": "ATE",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/automated-test-equipment/"
}

Record 23 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.