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Test program

Term · Semiconductors · MLC-T-SEM-000331

A set of instructions and parameters executed by automated test equipment (ATE) to verify the functionality and performance of a semiconductor device. It defines the sequence of electrical stimuli, expected responses, and measurement criteria for each test. Developing an effective test program requires expertise in both the device under test and the capabilities of the ATE system.

Table 1. Record
IdentifierMLC-T-SEM-000331
FieldSemiconductors
SubjectTest & Reliability
Record as JSON 
{
  "id": "MLC-T-SEM-000331",
  "term": "Test program",
  "field": "Semiconductors",
  "definition": "A set of instructions and parameters executed by automated test equipment (ATE) to verify the functionality and performance of a semiconductor device. It defines the sequence of electrical stimuli, expected responses, and measurement criteria for each test. Developing an effective test program requires expertise in both the device under test and the capabilities of the ATE system.",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/test-program/"
}

Record 347 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.