Failures in time

{
  "id": "MLC-T-SEM-000128",
  "term": "Failures in time",
  "field": "Semiconductors",
  "definition": "A unit of measurement for the failure rate of electronic components, representing the number of failures expected in one billion device-hours of operation. A FIT rate of 1 means one failure is expected every 10^9 hours of operation. This metric is widely used in reliability engineering to quantify the long-term reliability of semiconductor devices and systems.",
  "abbreviation": "FIT",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/failures-in-time/"
}