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Mean time between failures

Term · Semiconductors · MLC-T-SEM-000212

A measure of the reliability of a repairable system, representing the average time expected to pass between one failure and the next during normal operation. It is calculated as the total operating time of a population of devices divided by the total number of failures observed within that period. MTBF is often expressed in hours and is a key metric for predicting the operational lifespan of semiconductor components.

Table 1. Record
IdentifierMLC-T-SEM-000212
FieldSemiconductors
SubjectTest & Reliability
AbbreviationMTBF
Record as JSON
{
  "id": "MLC-T-SEM-000212",
  "term": "Mean time between failures",
  "field": "Semiconductors",
  "definition": "A measure of the reliability of a repairable system, representing the average time expected to pass between one failure and the next during normal operation. It is calculated as the total operating time of a population of devices divided by the total number of failures observed within that period. MTBF is often expressed in hours and is a key metric for predicting the operational lifespan of semiconductor components.",
  "abbreviation": "MTBF",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/mean-time-between-failures/"
}

Record 217 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.