Mean time between failures
Term · Semiconductors · MLC-T-SEM-000212
A measure of the reliability of a repairable system, representing the average time expected to pass between one failure and the next during normal operation. It is calculated as the total operating time of a population of devices divided by the total number of failures observed within that period. MTBF is often expressed in hours and is a key metric for predicting the operational lifespan of semiconductor components.
| Identifier | MLC-T-SEM-000212 |
|---|---|
| Field | Semiconductors |
| Subject | Test & Reliability |
| Abbreviation | MTBF |
Record as JSON
{
"id": "MLC-T-SEM-000212",
"term": "Mean time between failures",
"field": "Semiconductors",
"definition": "A measure of the reliability of a repairable system, representing the average time expected to pass between one failure and the next during normal operation. It is calculated as the total operating time of a population of devices divided by the total number of failures observed within that period. MTBF is often expressed in hours and is a key metric for predicting the operational lifespan of semiconductor components.",
"abbreviation": "MTBF",
"subject": "Test & Reliability",
"url": "https://mlchart.com/terminology/semiconductors/mean-time-between-failures/"
}
Record 217 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.