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High-temperature operating life

Term · Semiconductors · MLC-T-SEM-000161

A reliability stress test that accelerates the aging of a semiconductor device by operating it at an elevated temperature for an extended period. The purpose of the high temperature operating life (HTOL) test is to induce failures that would occur over a much longer time under normal operating conditions. Test conditions are defined by JEDEC standard JESD22-A108, specifying temperatures such as 125°C for 1000 hours.

Table 1. Record
IdentifierMLC-T-SEM-000161
FieldSemiconductors
SubjectTest & Reliability
AbbreviationHTOL
Record as JSON 
{
  "id": "MLC-T-SEM-000161",
  "term": "High-temperature operating life",
  "field": "Semiconductors",
  "definition": "A reliability stress test that accelerates the aging of a semiconductor device by operating it at an elevated temperature for an extended period. The purpose of the high temperature operating life (HTOL) test is to induce failures that would occur over a much longer time under normal operating conditions. Test conditions are defined by JEDEC standard JESD22-A108, specifying temperatures such as 125°C for 1000 hours.",
  "abbreviation": "HTOL",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/high-temperature-operating-life/"
}

Record 165 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.