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AEC-Q100

Term · Semiconductors · MLC-T-SEM-000015

A qualification standard for packaged integrated circuits used in automotive applications, established by the Automotive Electronics Council. This standard defines a set of stress tests and reliability requirements that components must pass to be deemed suitable for the harsh conditions found in vehicles. Compliance with AEC-Q100 indicates that a semiconductor device has met specific temperature, humidity, and electrical stress criteria for automotive use.

Table 1. Record
IdentifierMLC-T-SEM-000015
FieldSemiconductors
SubjectTest & Reliability
Record as JSON 
{
  "id": "MLC-T-SEM-000015",
  "term": "AEC-Q100",
  "field": "Semiconductors",
  "definition": "A qualification standard for packaged integrated circuits used in automotive applications, established by the Automotive Electronics Council. This standard defines a set of stress tests and reliability requirements that components must pass to be deemed suitable for the harsh conditions found in vehicles. Compliance with AEC-Q100 indicates that a semiconductor device has met specific temperature, humidity, and electrical stress criteria for automotive use.",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/aec-q100/"
}

Record 7 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.