Final test

{
  "id": "MLC-T-SEM-000134",
  "term": "Final test",
  "field": "Semiconductors",
  "definition": "The last set of electrical tests performed on a fully packaged and sealed semiconductor device before it is shipped to customers. This screening verifies the device's functionality, performance specifications, and quality under specified operating conditions, including different temperatures and voltages. Final test is distinct from wafer probe, which tests the die before it is cut and packaged.",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/final-test/"
}