Known good die

{
  "id": "MLC-T-SEM-000190",
  "term": "Known good die",
  "field": "Semiconductors",
  "definition": "An individual, unpackaged integrated circuit that has been tested and confirmed to meet all functional and performance specifications before final assembly. This testing of a known good die (KGD) is performed at the wafer level or after the die has been singulated from the wafer. KGD is used in multi-chip modules and system-in-package designs where replacing a faulty die after assembly is impractical or prohibitively expensive.",
  "abbreviation": "KGD",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/known-good-die/"
}