MLchartDataset catalogue

Wafer map

Term · Semiconductors · MLC-T-SEM-000351

A graphical representation showing the location and test result of each individual die on a semiconductor wafer. After electrical testing, each die is assigned a category, such as 'pass' or a specific 'fail' bin code, which is then displayed on the map using different colors or symbols. This visual data is used for yield analysis, identifying spatial patterns of failure that can point to systemic issues with the manufacturing process or equipment.

Table 1. Record
IdentifierMLC-T-SEM-000351
FieldSemiconductors
SubjectMetrology, Inspection & Yield
Record as JSON 
{
  "id": "MLC-T-SEM-000351",
  "term": "Wafer map",
  "field": "Semiconductors",
  "definition": "A graphical representation showing the location and test result of each individual die on a semiconductor wafer. After electrical testing, each die is assigned a category, such as 'pass' or a specific 'fail' bin code, which is then displayed on the map using different colors or symbols. This visual data is used for yield analysis, identifying spatial patterns of failure that can point to systemic issues with the manufacturing process or equipment.",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/wafer-map/"
}

Record 370 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.