Bin
Term · Semiconductors · MLC-T-SEM-000040
A category or group into which semiconductor devices are sorted based on their electrical performance characteristics after testing. Devices are assigned to different bins according to parameters such as operating frequency, power consumption, or leakage current. This sorting process separates functional devices from defective ones and groups functional devices with similar specifications, with each bin representing a specific product grade or quality level.
| Identifier | MLC-T-SEM-000040 |
|---|---|
| Field | Semiconductors |
| Subject | Metrology, Inspection & Yield |
Record as JSON
{
"id": "MLC-T-SEM-000040",
"term": "Bin",
"field": "Semiconductors",
"definition": "A category or group into which semiconductor devices are sorted based on their electrical performance characteristics after testing. Devices are assigned to different bins according to parameters such as operating frequency, power consumption, or leakage current. This sorting process separates functional devices from defective ones and groups functional devices with similar specifications, with each bin representing a specific product grade or quality level.",
"subject": "Metrology, Inspection & Yield",
"url": "https://mlchart.com/terminology/semiconductors/bin/"
}
Record 32 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.