Inspection

{
  "id": "MLC-T-SEM-000174",
  "term": "Inspection",
  "field": "Semiconductors",
  "definition": "The systematic examination of semiconductor wafers, reticles, or packaged devices to detect defects, contaminants, or deviations from design specifications. This process occurs at multiple stages of manufacturing, from incoming materials to final product, to identify issues that could impact device performance or reliability. Inspection tools often employ optical, electron beam, or X-ray techniques to achieve the necessary resolution.",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/inspection/"
}