MLchartDataset catalogue

Sampling plan

Term · Semiconductors · MLC-T-SEM-000290

A predetermined procedure for selecting a subset of items from a larger lot for inspection to assess the quality of the entire lot. This plan specifies the sample size, the acceptance criteria, and the rejection criteria based on the number of defects found. Common sampling plans include single, double, and multiple sampling, often guided by standards like MIL-STD-105E.

Table 1. Record
IdentifierMLC-T-SEM-000290
FieldSemiconductors
SubjectMetrology, Inspection & Yield
Record as JSON 
{
  "id": "MLC-T-SEM-000290",
  "term": "Sampling plan",
  "field": "Semiconductors",
  "definition": "A predetermined procedure for selecting a subset of items from a larger lot for inspection to assess the quality of the entire lot. This plan specifies the sample size, the acceptance criteria, and the rejection criteria based on the number of defects found. Common sampling plans include single, double, and multiple sampling, often guided by standards like MIL-STD-105E.",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/sampling-plan/"
}

Record 300 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.