MLchartDataset catalogue

Transmission electron microscope

Term · Semiconductors · MLC-T-SEM-000340

A type of electron microscope that transmits a beam of electrons through an ultra-thin sample to form an image. The electrons interact with the sample as they pass through, and the resulting transmitted electrons are used to create a highly magnified image. TEM provides detailed information about the internal structure, crystallography, and defects of materials at atomic resolution, making it invaluable for semiconductor material analysis.

Table 1. Record
IdentifierMLC-T-SEM-000340
FieldSemiconductors
SubjectMetrology, Inspection & Yield
AbbreviationTEM
Record as JSON 
{
  "id": "MLC-T-SEM-000340",
  "term": "Transmission electron microscope",
  "field": "Semiconductors",
  "definition": "A type of electron microscope that transmits a beam of electrons through an ultra-thin sample to form an image. The electrons interact with the sample as they pass through, and the resulting transmitted electrons are used to create a highly magnified image. TEM provides detailed information about the internal structure, crystallography, and defects of materials at atomic resolution, making it invaluable for semiconductor material analysis.",
  "abbreviation": "TEM",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/transmission-electron-microscope/"
}

Record 359 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.