MLchartDataset catalogue

Failure mode and effects analysis

Term · Semiconductors · MLC-T-SEM-000127

A systematic, proactive method for evaluating a process to identify where and how it might fail and to assess the relative impact of different failures. The failure mode and effects analysis (FMEA) technique involves identifying potential failure modes, their causes, and their effects on the final product. Each potential failure is scored on severity, occurrence, and detection to calculate a risk priority number (RPN) for prioritizing corrective actions.

Table 1. Record
IdentifierMLC-T-SEM-000127
FieldSemiconductors
SubjectMetrology, Inspection & Yield
AbbreviationFMEA
Record as JSON 
{
  "id": "MLC-T-SEM-000127",
  "term": "Failure mode and effects analysis",
  "field": "Semiconductors",
  "definition": "A systematic, proactive method for evaluating a process to identify where and how it might fail and to assess the relative impact of different failures. The failure mode and effects analysis (FMEA) technique involves identifying potential failure modes, their causes, and their effects on the final product. Each potential failure is scored on severity, occurrence, and detection to calculate a risk priority number (RPN) for prioritizing corrective actions.",
  "abbreviation": "FMEA",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/failure-mode-and-effects-analysis/"
}

Record 126 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.