MLchartDataset catalogue

Killer defect

Term · Semiconductors · MLC-T-SEM-000189

A defect on a semiconductor wafer or integrated circuit that causes a device to fail electrically or functionally. Unlike benign defects, killer defects directly lead to non-working chips and thus reduce manufacturing yield. Identifying the root cause of killer defects is a primary focus in yield improvement efforts, often involving advanced failure analysis techniques.

Table 1. Record
IdentifierMLC-T-SEM-000189
FieldSemiconductors
SubjectMetrology, Inspection & Yield
Record as JSON 
{
  "id": "MLC-T-SEM-000189",
  "term": "Killer defect",
  "field": "Semiconductors",
  "definition": "A defect on a semiconductor wafer or integrated circuit that causes a device to fail electrically or functionally. Unlike benign defects, killer defects directly lead to non-working chips and thus reduce manufacturing yield. Identifying the root cause of killer defects is a primary focus in yield improvement efforts, often involving advanced failure analysis techniques.",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/killer-defect/"
}

Record 193 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.