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Murphy's yield model

Term · Semiconductors · MLC-T-SEM-000222

A mathematical formula used to predict the manufacturing yield of integrated circuits by relating die area to defect density. The model assumes that defects are randomly distributed across a wafer and calculates the probability of a die of a certain size being defect-free. It is expressed as Y equals the square of the quantity (1 minus e to the power of negative AD) all divided by AD, where Y is yield, A is die area, and D is defect density.

Table 1. Record
IdentifierMLC-T-SEM-000222
FieldSemiconductors
SubjectMetrology, Inspection & Yield
Record as JSON 
{
  "id": "MLC-T-SEM-000222",
  "term": "Murphy's yield model",
  "field": "Semiconductors",
  "definition": "A mathematical formula used to predict the manufacturing yield of integrated circuits by relating die area to defect density. The model assumes that defects are randomly distributed across a wafer and calculates the probability of a die of a certain size being defect-free. It is expressed as Y equals the square of the quantity (1 minus e to the power of negative AD) all divided by AD, where Y is yield, A is die area, and D is defect density.",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/murphy-s-yield-model/"
}

Record 228 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.