Particle

{
  "id": "MLC-T-SEM-000240",
  "term": "Particle",
  "field": "Semiconductors",
  "definition": "A microscopic piece of foreign material, such as dust, organic residue, or process byproducts, that can contaminate semiconductor wafers during fabrication. These contaminants can cause electrical shorts, open circuits, or other defects that degrade device performance or lead to device failure. Cleanroom environments are designed to minimize particle counts, often specified in particles per cubic foot at a given size.",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/particle/"
}