MLchartDataset catalogue

Pareto

Term · Semiconductors · MLC-T-SEM-000381

A statistical analysis method that identifies and ranks the most frequent causes of a problem, such as manufacturing defects or yield loss. By applying the Pareto principle, which states that a large majority of problems (80%) are produced by a few key causes (20%), engineering efforts can be focused for maximum impact. The analysis is visualized in a Pareto chart, a bar graph showing defect frequencies in descending order.

Table 1. Record
IdentifierMLC-T-SEM-000381
FieldSemiconductors
SubjectMetrology, Inspection & Yield
Record as JSON 
{
  "id": "MLC-T-SEM-000381",
  "term": "Pareto",
  "field": "Semiconductors",
  "definition": "A statistical analysis method that identifies and ranks the most frequent causes of a problem, such as manufacturing defects or yield loss. By applying the Pareto principle, which states that a large majority of problems (80%) are produced by a few key causes (20%), engineering efforts can be focused for maximum impact. The analysis is visualized in a Pareto chart, a bar graph showing defect frequencies in descending order.",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/pareto/"
}

Record 247 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.