MLchartDataset catalogue

Control chart

Term · Semiconductors · MLC-T-SEM-000071

A graph used to study how a process changes over time by plotting data points in sequence. The chart displays a central line for the average, an upper line for the upper control limit, and a lower line for the lower control limit. Process stability is assessed using specific criteria, such as the Western Electric Rules, which define patterns that indicate a process is out of statistical control.

Table 1. Record
IdentifierMLC-T-SEM-000071
FieldSemiconductors
SubjectMetrology, Inspection & Yield
Record as JSON 
{
  "id": "MLC-T-SEM-000071",
  "term": "Control chart",
  "field": "Semiconductors",
  "definition": "A graph used to study how a process changes over time by plotting data points in sequence. The chart displays a central line for the average, an upper line for the upper control limit, and a lower line for the lower control limit. Process stability is assessed using specific criteria, such as the Western Electric Rules, which define patterns that indicate a process is out of statistical control.",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/control-chart/"
}

Record 66 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.