MLchartDataset catalogue

Cpk

Term · Semiconductors · MLC-T-SEM-000072

A process capability index that measures how close a process is to its specification limits relative to its natural variation. It accounts for both the spread of the data and its centering within the specification range. A Cpk value of 1.33 is often considered a minimum acceptable level for many semiconductor manufacturing processes.

Table 1. Record
IdentifierMLC-T-SEM-000072
FieldSemiconductors
SubjectMetrology, Inspection & Yield
Record as JSON 
{
  "id": "MLC-T-SEM-000072",
  "term": "Cpk",
  "field": "Semiconductors",
  "definition": "A process capability index that measures how close a process is to its specification limits relative to its natural variation. It accounts for both the spread of the data and its centering within the specification range. A Cpk value of 1.33 is often considered a minimum acceptable level for many semiconductor manufacturing processes.",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/cpk/"
}

Record 67 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.