Yield

{
  "id": "MLC-T-SEM-000367",
  "term": "Yield",
  "field": "Semiconductors",
  "definition": "The percentage of functional integrated circuits, or dies, produced from a single silicon wafer relative to the total possible number. This primary metric for manufacturing efficiency is calculated by dividing the number of good dies by the total number of dies on the wafer. Yield loss results from process variations, equipment malfunctions, or particulate contamination, with mature processes achieving yields above 95% while new processes start much lower.",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/yield/"
}