MLchartDataset catalogue

Overall equipment effectiveness

Term · Semiconductors · MLC-T-SEM-000380

A metric used to measure the manufacturing productivity of a piece of equipment or a production line, expressed as a percentage. This effectiveness, abbreviated as OEE, is calculated by multiplying three factors: availability (uptime), performance (speed), and quality (yield). A perfect OEE score of 100% indicates that the equipment is producing only good parts, as fast as possible, and without interruption.

Table 1. Record
IdentifierMLC-T-SEM-000380
FieldSemiconductors
SubjectEquipment & Automation
AbbreviationOEE
Record as JSON 
{
  "id": "MLC-T-SEM-000380",
  "term": "Overall equipment effectiveness",
  "field": "Semiconductors",
  "definition": "A metric used to measure the manufacturing productivity of a piece of equipment or a production line, expressed as a percentage. This effectiveness, abbreviated as OEE, is calculated by multiplying three factors: availability (uptime), performance (speed), and quality (yield). A perfect OEE score of 100% indicates that the equipment is producing only good parts, as fast as possible, and without interruption.",
  "abbreviation": "OEE",
  "subject": "Equipment & Automation",
  "url": "https://mlchart.com/terminology/semiconductors/overall-equipment-effectiveness/"
}

Record 244 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.