Statistical process control

{
  "id": "MLC-T-SEM-000320",
  "term": "Statistical process control",
  "field": "Semiconductors",
  "definition": "A method of quality control that uses statistical techniques to monitor and manage a manufacturing process. Statistical process control (SPC) involves collecting real-time data, plotting it on control charts, and using this information to distinguish between natural process variability and variations caused by assignable events. Control charts are defined by upper and lower control limits, which are calculated as three standard deviations from the process mean.",
  "abbreviation": "SPC",
  "subject": "Metrology, Inspection & Yield",
  "url": "https://mlchart.com/terminology/semiconductors/statistical-process-control/"
}