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Leakage

Term · Semiconductors · MLC-T-SEM-000196

The unintended flow of electrical current through a transistor when it is in its off state and should be blocking current. This phenomenon is a primary source of static power consumption in modern integrated circuits, contributing to heat generation and reduced battery life in portable devices. Major mechanisms include subthreshold leakage, which occurs below the transistor's threshold voltage, and gate-oxide leakage through the thin insulating layer.

Table 1. Record
IdentifierMLC-T-SEM-000196
FieldSemiconductors
SubjectDesign, EDA & Devices
Record as JSON 
{
  "id": "MLC-T-SEM-000196",
  "term": "Leakage",
  "field": "Semiconductors",
  "definition": "The unintended flow of electrical current through a transistor when it is in its off state and should be blocking current. This phenomenon is a primary source of static power consumption in modern integrated circuits, contributing to heat generation and reduced battery life in portable devices. Major mechanisms include subthreshold leakage, which occurs below the transistor's threshold voltage, and gate-oxide leakage through the thin insulating layer.",
  "subject": "Design, EDA & Devices",
  "url": "https://mlchart.com/terminology/semiconductors/leakage/"
}

Record 200 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.