MLchartDataset catalogue

Probe card

Term · Semiconductors · MLC-T-SEM-000264

A specialized interface assembly that provides electrical contact between a wafer prober and the individual die on a semiconductor wafer during electrical testing. It consists of a printed circuit board with an array of fine metallic needles or membranes that precisely align with the bond pads or test points of each die. Probe cards are custom-designed for specific wafer layouts and test requirements.

Table 1. Record
IdentifierMLC-T-SEM-000264
FieldSemiconductors
SubjectTest & Reliability
Record as JSON 
{
  "id": "MLC-T-SEM-000264",
  "term": "Probe card",
  "field": "Semiconductors",
  "definition": "A specialized interface assembly that provides electrical contact between a wafer prober and the individual die on a semiconductor wafer during electrical testing. It consists of a printed circuit board with an array of fine metallic needles or membranes that precisely align with the bond pads or test points of each die. Probe cards are custom-designed for specific wafer layouts and test requirements.",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/probe-card/"
}

Record 273 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.