MLchartDataset catalogue

Burn-in

Term · Semiconductors · MLC-T-SEM-000047

A stress testing process applied to semiconductor devices, typically integrated circuits, to accelerate early-life failures. Devices are operated at elevated temperatures and voltages for a specified duration, screening out components with latent defects that would otherwise fail prematurely in the field. This process aims to move devices past the 'infant mortality' phase of the bathtub curve before shipment.

Table 1. Record
IdentifierMLC-T-SEM-000047
FieldSemiconductors
SubjectTest & Reliability
Record as JSON 
{
  "id": "MLC-T-SEM-000047",
  "term": "Burn-in",
  "field": "Semiconductors",
  "definition": "A stress testing process applied to semiconductor devices, typically integrated circuits, to accelerate early-life failures. Devices are operated at elevated temperatures and voltages for a specified duration, screening out components with latent defects that would otherwise fail prematurely in the field. This process aims to move devices past the 'infant mortality' phase of the bathtub curve before shipment.",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/burn-in/"
}

Record 39 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.