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Test escape

Term · Semiconductors · MLC-T-SEM-000330

A defective semiconductor device that passes all manufacturing tests and is shipped to a customer. These escapes occur when the test program fails to detect a specific fault, either due to incomplete test coverage or a malfunction in the test equipment itself. The rate of test escapes is measured in defective parts per million (DPPM), with targets for mature products often falling below 10 DPPM.

Table 1. Record
IdentifierMLC-T-SEM-000330
FieldSemiconductors
SubjectTest & Reliability
Record as JSON 
{
  "id": "MLC-T-SEM-000330",
  "term": "Test escape",
  "field": "Semiconductors",
  "definition": "A defective semiconductor device that passes all manufacturing tests and is shipped to a customer. These escapes occur when the test program fails to detect a specific fault, either due to incomplete test coverage or a malfunction in the test equipment itself. The rate of test escapes is measured in defective parts per million (DPPM), with targets for mature products often falling below 10 DPPM.",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/test-escape/"
}

Record 346 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.