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Design for test

Term · Semiconductors · MLC-T-SEM-000090

A set of design techniques and methodologies incorporated into a semiconductor device from its initial conception to facilitate efficient and effective testing. DFT features, such as scan chains and built-in self-test (BIST) structures, allow for high fault coverage and reduced test time during manufacturing. Implementing DFT early in the design cycle can significantly lower the overall cost of testing.

Table 1. Record
IdentifierMLC-T-SEM-000090
FieldSemiconductors
SubjectTest & Reliability
AbbreviationDFT
Record as JSON 
{
  "id": "MLC-T-SEM-000090",
  "term": "Design for test",
  "field": "Semiconductors",
  "definition": "A set of design techniques and methodologies incorporated into a semiconductor device from its initial conception to facilitate efficient and effective testing. DFT features, such as scan chains and built-in self-test (BIST) structures, allow for high fault coverage and reduced test time during manufacturing. Implementing DFT early in the design cycle can significantly lower the overall cost of testing.",
  "abbreviation": "DFT",
  "subject": "Test & Reliability",
  "url": "https://mlchart.com/terminology/semiconductors/design-for-test/"
}

Record 85 of 390 in Semiconductors terminology (MLC-0108). Request the full dataset.